List of Publications

Hayk H. BEZIRGANYAN (Jr.)

[1]. Bezirganyan P.H. (Jr.), Bezirganyan H.P., Bezirganyan S.E. and Bezirganyan H.H. (Jr.), The Standing Wave Formed by Grazing-Incidence X-rays in a Multilayer with Planes Normal to Surface. // Abstracts XVIII IUCr Congress and General Assembly, Glasgow ( Scotland, UK ), p. 177, 4 th - 13 th August 1999; //Acta Cryst. A55 Supplement (1999), Abstract P12.OE.001 ( 12MB).         [2]. Bezirganyan P.H. (Jr.), Bezirganyan H.P., Bezirganyan S.E. and Bezirganyan H.H. (Jr.), Standing Wave Formed Close to Rectangular Surface Grating by the Grazing-Angle Incidence X-rays. //Abstracts of 19th European Crystallographic Meeting (ECM-19), Nancy, France, s4.m1.p5, 25th - 31st August 2000; Acta Cryst. A 56, Supplement (August 2000), s205. //Proc. 5 th Biennial Conference on X-ray Topography and High Resolution Diffraction, Ustron-Jaszowiec (Poland), P2.58, p.186, 13th - 15th September 2000.        [3]. Bezirganyan P.H. (Jr.), Bezirganyan H.P., Bezirganyan S.E. and Bezirganyan H.H. (Jr.), The Grazing-Angle Incidence X-ray Diffraction (GIXD) by the Micro and Nano-Structures with Cosine-like Polarizability (Symmetrical Laue geometry if qB << p). // 9 th Annual Conference Proceedings on Electron Microscopy-2000, Yerevan (Armenia), pp.31,32, 17th - 20th October 2000.       [4]. Bezirganyan P.H. (Jr.), Bezirganyan H.P., Bezirganyan S.E. and Bezirganyan H.H. (Jr.), X-Ray Specular Backdiffraction from Thin Crystalline Layer Deposited on the Crystalline Substrate. //Abstracts of Materials Research Society (MRS) 2001 Spring Meeting, San Francisco, CA, R5.4, p.322, 16th - 20th April 2001.        [5]. Bezirganyan P.H. (Jr.), Bezirganyan H.P., Bezirganyan S.E. and Bezirganyan H.H. (Jr.), X-ray Specular Backdiffraction from Crystalline Substrate with Thin Amorphous Surface Layer. // 10 th Annual Conference Proceedings on Electron Microscopy-2001, Yerevan (Armenia), pp.35 - 37, 23 rd - 26 th October 2001.        [6]. Bezirganyan H.H. (Jr.), Bezirganyan S.E., Bezirganyan H.P. and Bezirganyan P.H. (Jr.), Grazing-angle Incidence X-ray Diffraction by the Si1-a(x)-b(x)Gea(x)Cb(x)/Si Heterojunction where the Germanium and the Carbon Concentrations are Periodically Varying along the Flat Layer Surface. //Abstracts of Materials Research Society (MRS) 2002 Spring Meeting, San Francisco, CA, B4.31, p.55, 1 st - 5 th April 2002. //In Silicon Materials - Processing, Characterization, and Reliability, edited by Veteran J., O'Meara D.L., Misra V., Ho P., Mat. Res. Soc. Symp. Proc., v.716, San Francisco, CA, 2002, pp. 239 - 244.        [7]. Bezirganyan S.E., Bezirganyan H.P., Bezirganyan H.H. (Jr.) and Bezirganyan P.H. (Jr.), X-ray Diffraction by Heterojunction when Surface Layer Polarizability has a Parabolic Distribution. //Abstracts of American Crystallographic Association (ACA) 2002 Annual Meeting, San Antonio, Texas (USA), P128 (E0022), p.128, 25 th - 30 th May 2002.        [8]. Bezirganyan H.P., Bezirganyan S.E., Bezirganyan H.H. (Jr.) and Bezirganyan P.H. (Jr.), Investigation of Si1-a-b Gea Cb / Si Strain-Compensated Heterojunction by the X-rays Backdiffraction Method. //Book of Abstracts of EDXRS 2002 Conference, Berlin (Germany), p.16, 16 th - 21 st June 2002.        [9]. Bezirganyan H.P., Bezirganyan S.E., Bezirganyan H.H. (Jr.) and Bezirganyan P.H. (Jr.), The Vacuum Standing - Wave with Nodes Formed Parallel to X - ray Entrance Surface of the Si1-a-b Gea Cb / Si Strain-Compensated Heterojunction. // Book of Abstracts of the 9 th Conference on Total Reflection X-Ray Fluorescence Analysis (TXRF) and Related Methods, University of Madeira, Funchal, Madeira (Portugal), P-20, p. 67, 8 th - 13 th September 2002.        [10]. Bezirganyan H.P., Bezirganyan S.E., Bezirganyan H.H. (Jr.) and Bezirganyan P.H. (Jr.), Backdiffraction Configuration for X-ray Standing Wave Formed just above the Surface of the Crystal Containing a Stacking Fault. //Abstracts' Book of International Conference on X-Rays and Related Techniques in Research and Industry (ICXRI) 2002, Shah Alam, Selangor (Malaysia), p. 17, 30 th - 31 st October 2002. //Malaysian Journal of Science, 2002, v. 21A (Special Issue), pp. 31 - 40.         [11]. Bezirganyan P.H. (Jr.), Bezirganyan H.P., Bezirganyan S.E., Bezirganyan H.H. (Jr.) and Hovnanyan K.O., Grazing-Angle Incidence X-ray Diffraction by Si1-a(x)Gea(x) Thin Layer if the Composition Coefficient a(x) is Varying Harmonically Along the Flat Layer Surface. //Spectrochim. Acta, Part B, 2003, v. 58 (4, Special Issue), pp. 745 - 757.         [12]. Bezirganyan S.E., Bezirganyan H.H. (Jr.), Bezirganyan H.P. and Bezirganyan P.H. (Jr.), Determination of Space Shift of Si/SiGe/Si Heterojunction's Cap Layer by Grazing-angle Incidence X-ray Backdiffraction Technique. //Abstracts of Materials Research Society (MRS) 2003 Spring Meeting, San Francisco, CA, G3.1, pp.151,152, 21 st - 25 th April 2003. //In Integration of Heterogeneous Thin-Film Materials and Devices, edited by Atwater H.A., Current M.I., Levy M., Sands T.D., Mat. Res. Soc. Symp. Proc., v.768, San Francisco, CA, 2003, pp. G3.1.1 - G3.1.6.         [13]. Bezirganyan H.P., Bezirganyan H.H. (Jr.), Bezirganyan S.E. and Bezirganyan P.H. (Jr.), Study of Crystal-Amorphous State Transitional Layer by Grazing-angle Incidence X-ray Backdiffraction Technique. //Proc. on 11th Conference of Armenian Electron Microscopy Society (AEMS), Yerevan (Armenia), pp.40-45, 20th, 21st November 2003.       [14]. Bezirganyan S.E., Bezirganyan H.H. (Jr.), Bezirganyan H.P. and Bezirganyan P.H. (Jr.), Quantitative Analysis of Average Crystallization Rate by Grazing-Angle Incidence X-ray Backdiffraction Technique. //Abstracts of Materials Research Society (MRS) 2004 Spring Meeting, San Francisco, CA, A9.19, p.31, 12 th - 16 th April 2004 (Abstracts of MRS Symposium A: 5,18MB).       [15]. Bezirganyan H.P., Bezirganyan H.H. (Jr.), Bezirganyan S.E. and Bezirganyan P.H. (Jr.), Investigation of Si/SiGe/Si Heterojunction with Relaxed Layers by Grazing-Angle Incidence X-ray Backdiffraction Technique. //Book of Abstracts of European X-Ray Spectrometry Conference (EXRS 2004), Alghero, Sardinia (Italy), 22A, p.26, 6 th - 11 th June 2004 (Scientific Program 155KB).       [16]. Bezirganyan H.P., Bezirganyan H.H. (Jr.), Bezirganyan S.E. and Bezirganyan P.H. (Jr.), Specular beam suppression and enhancement phenomena in the case of grazing-angle incidence X-rays backdiffraction by the crystal with stacking fault. //Opt. Comm., 2004, v. 238 (Issues 1-3), pp. 13-28.         [17]. Bezirganyan H.P., Bezirganyan H.H. (Jr.), Bezirganyan S.E. and Bezirganyan P.H. (Jr.), Ultrahigh-Density Semiconductor Data Storage Media Useful for Data Readout by X-ray Microbeam. //Book of Abstracts of III International Optical Congress “Optics - XXI Century” & III International Conference “Basic Problems of Optics”, Topical Meeting on Optoinformatics, Saint-Petersburg (Russia), p.48, 18 th - 21 st October 2004.       [18]. Bezirganyan S.E., Bezirganyan H.H. (Jr.), Bezirganyan H.P. and Bezirganyan P.H. (Jr.), Fine Determination of the Lattice Longitudinal Shift Between Layers of the Strain-Compensated Si/SiGeC/Si HBT. //Abstracts of Materials Research Society (MRS) 2004 Fall Meeting, Boston, MA (USA), B9.24, p.59, 29th November - 3 rd December 2004 (Abstracts of MRS Symposium B: 4,65MB).     Back to Main Page